Leiden University Student Repository

Fuchs, Tim Martijn (2017)

Displacement Measuring Interferometry for use in Cryogenic Low Energy Electron Microscopy

Bachelor thesis | Natuurkunde (BSc)

In this thesis we present two distinct interferometric set-ups for displacement measuring interferometry in cryogenic Low Energy Electron Microscopy (LEEM), specifically for use in ESCHER, the LEEM at Leiden University. The set-ups are based on: 1. circular polarization and 2. 3x3 fiber couplers to obtain a quadrature measurement. Whilst the 3x3 coupler based set-up is limited by thermal drift and other environmental effects, the circular polarization based method displays a 3\sigma resolution of 1.75 nm, and we provide a framework for further increasing this resolution, including a set of alternate set-ups with slight added complexity but a great potential gain in resolution. Keywords: Displacement, Interferometry, Fiber Couplers, Polarization, LEEM, cryogenic, DMI, Quadrature, Fiber.

Low Energy Electron Microscopy

Displacement Measuring Interferometry

Circular Polarization

Cryogenic

Fiber Coupler

Fiber

Author

Fuchs, Tim Martijn

Faculty

Faculty of Science

Supervisors

Molen, Sense Jan van der

ECTS Credits

3

Language

en