Leiden University Student Repository

Uitenbroek, Dennis (2018)

Local tilt angle measurement of two-dimensional materials using LEEM

Bachelor thesis | Natuurkunde (BSc)

Amethod to measure local tilt angles of two-dimensional materials in LEEM is developed. To create these local tilt angles graphene is stamped on top of pillars which are 55 nm high and 1 μm in diameter. The measurement method uses an aperture to select a spot on the sample and moved the sample to measure all over the sample. These spots are measured in diffraction space. By analyzing all diffraction images, a magnitude and an orientation of local tilt angles are obtained. The spatial resolution of this method is bound by the size of the aperture. In this experiment a spatial resolution of 338 nm is achieved. The angular resolution depends on the locating method of the diffraction spot. In this experiment an angular resolution of one degree is achieved.

tilt

angle

measurement

LEEM

two

dimensional

2d

2D

local

diffraction

Author

Uitenbroek, Dennis

Faculty

Faculty of Science

Supervisors

Molen, Sense Jan van der

ECTS Credits

3

Language

en