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(1 - 8 of 8)
Microwave mode identification of TECH plasma
Josephson Junctions from Van der Waals Materials
Study of Kirkpatrick-Baez X-ray optics made with Silicon Pore Optics for full-field X-ray fluorescence microscope
All You Need Is Light - Characterizing Beetles With Stokes Parameters
Characterizing and Simulating Transition Edge Sensors
Integrated Photonics for the Realisation of Multiport Interferometers
Spatial Bunching of Entangled Four Photons
Search for spatially entangled photon pairs from a 2 mm PPKTP crystal