Amethod to measure local tilt angles of two-dimensional materials in LEEM is developed. To create these local tilt angles graphene is stamped on top of pillars which are 55 nm high and 1 μm in...Show moreAmethod to measure local tilt angles of two-dimensional materials in LEEM is developed. To create these local tilt angles graphene is stamped on top of pillars which are 55 nm high and 1 μm in diameter. The measurement method uses an aperture to select a spot on the sample and moved the sample to measure all over the sample. These spots are measured in diffraction space. By analyzing all diffraction images, a magnitude and an orientation of local tilt angles are obtained. The spatial resolution of this method is bound by the size of the aperture. In this experiment a spatial resolution of 338 nm is achieved. The angular resolution depends on the locating method of the diffraction spot. In this experiment an angular resolution of one degree is achieved.Show less