This thesis deals with the use of conducting AFM to image the topography and conducting properties of graphene on SiO2. Specifically,the current image will be used to distinguish graphene from SiO2...Show moreThis thesis deals with the use of conducting AFM to image the topography and conducting properties of graphene on SiO2. Specifically,the current image will be used to distinguish graphene from SiO2 and the height image to identify the edge of the wafer. These together can show how far graphene reaches this edge. For testing the usability of the Conducting AFM module measurements were also made on gold and on graphite. Lastly, specific settings were tested and discussed for optimal current imaging results.Show less