Performing real-time non-invasive nanoscale microscopy on surfaces is essential to studies of plasmonics, electrochemistry and protein dynamics. Optical near-field electron microscopy (ONEM) is a...Show morePerforming real-time non-invasive nanoscale microscopy on surfaces is essential to studies of plasmonics, electrochemistry and protein dynamics. Optical near-field electron microscopy (ONEM) is a proposed imaging technique that achieves this by converting an optical near-field image to an electron image through a low-workfunction thin-film photocathode and imaging these electrons with the detection optics of a low-energy electron microscope (LEEM). In this thesis, we perform theory, sample fabrication and microscopy experiments as a stepping stone towards ONEM. We focus on photocathode properties and resolution considerations.Show less
Diffraction distortion in LEEM diffraction imaging makes it impossible to measure angles and distances accurately. In a LEEM this diffraction distortion changes when the sample measured is changed...Show moreDiffraction distortion in LEEM diffraction imaging makes it impossible to measure angles and distances accurately. In a LEEM this diffraction distortion changes when the sample measured is changed meaning it needs to be corrected each time. In this thesis the method for an in-place correction is explained and applied. The method successfully allows the measurement of angles and distances without requiring the measurement of too much data. However, it can still be improved upon so that less data is needed and a better correction is acquired.Show less
