Combining an applied thermal potential with Conductive Atomic Force Microscopy (C-AFM) enables the measurement of thermoelectric properties of Self-Assembled Monolayers (SAM). Such measurements can...Show moreCombining an applied thermal potential with Conductive Atomic Force Microscopy (C-AFM) enables the measurement of thermoelectric properties of Self-Assembled Monolayers (SAM). Such measurements can be used to show the presence of destructive quantum interference in molecules. To study the feasibility of measuring thermoelectric potentials over SAMs with C-AFM, we have simulated the temperature distribution around the tip in a typical C-AFM setup with finite element simulations in Comsol. These show that a sufficiently large temperature difference can develop across the molecular layer to measure the thermoelectric properties.Show less
