Leiden University Student Repository

Benschop, Tjerk (2018)

Towards Scanning Tunneling Microscopy Measurements on Micrometer-Sized Graphene Flakes

Master thesis | Physics (MSc)

Motivated by the recent discovery of superconductivity in Magic Angle Twisted Bilayer Graphene, we discuss preparatory work for STM measurements on micrometer-sized graphene flakes. We develop and fabricate a dummy sample for testing capacitive navigation in any STM setup with an XY-stage. Furthermore, we calculate the effect of a biased STM tip on the charge distribution in a graphene bilayer. We also estimate the chemical potential shift in a gated graphene sample as a result of the probe tip. All results unambiguously suggest that the STM tip will strongly influence the electrical behavior of the graphene system.

STM

Flake

Graphene

Scanning Tunneling Microscopy

Capacitive Navigation

TIBB

Author

Benschop, Tjerk

Faculty

Faculty of Science

Specialisation

MSc

Supervisors

Allan, Milan

ECTS Credits

5

Language

en